除了直流I-V和电容测量,脉冲式I-V测量也可用于得出太阳能电池的某些参数。特别是,脉冲式I-V[1]测量在判断转换效率、最短载流子寿命和电池电容的影响时一直非常有用。
In addition to DC I-V and capacitance measurements, pulsed I-V measurements may be useful for deriving parameters of a solar cell. In particular, pulsed I-V measurements have been useful in determining the conversion efficiency, minimum carrier lifetime, and the effects of cell capacitance.
本文详细介绍的这些PV测量操作都可以利用针对半导体评测设计的自动化测试系统快速而简便地实现,例如来自吉时利仪器公司的4200-SCS半导体特征分析系统4。该系统能够采用四针探测方式提供并吸收电流,并支持软件控制的电流、电压和电容测量。该系统可以配置各种源和测量模块,进行连续式的和脉冲式的I-V与C-V测量,得到一些重要的PV电池参数。例如,该系统可以利用4225-PMU[2]模块连接到PV电池上进行脉冲式I-V扫描(如图8所示)5。除了提供脉冲电压源,该PMU还能够吸收电流,从而测出太阳能电池的输出电流,如图9所示。4200-SCS[3]系统支持各种硬件模块和软件测量函数库。
The PV measurements detailed here can be made quickly and simply by using an automated test system designed for evaluating semiconductors, such as the Model 4200-SCS Semiconductor Characterization System from Keithley Instruments.[4] The system can source and sink current using a four-probe approach, and make software-controlled measurements of current, voltage, and capacitance. The system can be outfitted with a variety of source and measurement modules to make continuous and pulsed I‑V and C‑V measurements for deriving important PV cell parameters. For example, the system can be connected to a PV cell to perform a pulsed I‑V sweep using a Model 4225-PMU module (Fig. 8).[5] In addition to sourcing a pulsed voltage, the PMU can sink current so it can measure a solar cell’s output current as shown in Fig 9. The Model 4200-SCS system is supported by a wide array of hardware modules and software measurement function libraries.
太阳能电池
SMA同轴线
连接公共端
图8. 4225-PMU模块可用于PV电池的脉冲式I-V测量
Fig 8. The Model 4225-PMU module can be used to make pulsed I‑V measurements on a PV cell.
图9. 硅PV电池脉冲式I-V测量的绘图表示曲线
Fig 9. This curve is a graphical representation of pulsed I‑V measurements on a silicon PV cell.
作者简介
MaryAnne Tupta是吉时利仪器公司高级应用工程师。她在John Carroll大学获得物理/电子工程学士学位和物理学硕士学位。她自1988年以来一直帮助吉时利的用户进行仪器应用工作。她的联系电话是440-498-2715,电子邮箱为mtupta@keithley.com。
About the Author
MaryAnne Tupta is a senior applications engineer at Keithley Instruments, Inc. She earned a B.S. in physics/electronic engineering and an M.S. in physics from John Carroll University. She has assisted Keithley customers with instrument applications since 1988. She can be reached at 440-498-2715 or mtupta@keithley.com.
[1] 脉冲式I-V、Q点、双通道、脉冲工具包http://www.keithley.com.cn/semi/4200scs/4200piv
[2] 4225-PMU超快I-V模块http://www.keithley.com.cn/products/semiconductor/parametricanalyzer/4200scs/?mn=4225-PMU
[3] 4200-SCS型半导体特征分析系统http://www.keithley.com.cn/products/localizedproducts/currentvoltage/4200scs
[4] 吉时利仪器公司“基于4200-SCS半导体特征分析系统的光伏材料与太阳能电池电气特征分析”3026号应用笔记www.keithley.com.
[5]吉时利仪器公司“4225-PMU超快I-V模块的超快I-V应用”,电子书, www.keithley.com.