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In multiple device tests, such as those that involve burn-in, multiple parts are measured simultaneously over a specified period. A continuous current flow is usually mandatory to drive the DUTs, but multiple light detectors may be multiplexed to a current meter through a switching system. The appropriate choices for switching system and meter will be dictated by the dynamic range of the currents of interest.

在多器件测试情况下，例如涉及老化的测试，我们要在规定的时间内同时测量多个部件。驱动DUT通常需要连续的电流，但是多个光学探测器可以通过开关系统复用一个电流计。用户可以根据所测电流的动态量程选择合适的开关系统和电流计。

Various switch options are applicable to testing multiple LEDs. For example, the Model 3706 System Switch/Multimeter has six switch module slots, so it can handle up to 576 multiplexed channels or 2688 matrix cross-points. Like Series 2600A instruments, it includes an on-board TSP and a TSP-Link® inter-unit communication/triggering bus, which allows integrating these instruments into a system quickly and easily. This integration allows tight synchronization of operations between the instruments and lets them operate from a single test script. Figure 3 illustrates a three-LED device test system with one photodiode (PD) channel.

多LED器件测试可以选择多种类型的开关。例如，3706型开关/万用表具有6个开关模块插槽，因此它最多可支持576个复用通道或者2688个矩阵交叉点。与2600A系列仪器类似，它也内置了板载TSP和TSP-Link®设备间通信/触发总线，利用这套总线可以快速而方便地将这些仪器集成到一个系统中。这种集成支持紧密同步的仪器间操作，并且能够让它们在一个测试脚本的控制下进行操作。图3给出了具有一个光电二极管（PD）通道的三LED器件测试系统结构。

Figure 3. Block diagram with scalable Model 2602A SourceMeter channels for an LED array test system.

2602A通道A、2602A通道B、2602A通道A、2602A通道B、TSP-Link

图3. 采用可扩展2602A数字源表通道构建LED阵列测试系统的模块图